Inner Layer Prevents Static From Generating Inside the Bag

• Provide Faraday Cage Protection and Visibility For Highly Sensitive CMOS, MOS and Other Components
• Capacitive Probe (1 KV) <20 volts Per Test Method EIA Std 541 Appendix E
• Static Decay Rate (5000 to 0 volts) <0.03 seconds Using Test Method FTMS 101C Method 4046.1
• Tested Per MIL-PRF-81705D
• High Quality 3 Mil (.003") ESD Static Shielding Bags
• Reliable Pressure Activated Zip Top Closure
• Manufactured With a Transparent Layered Laminate
• Provides Optimum Static Shielding With Maximum Visibility
• Metalized Polyester Outer Layer Provides Static Shielding From External Sources
• Abrasion Resistant Exterior
• Maintains Static Shielding Capabilities Even Under Rugged Handling and Reuse
• Excellent For Storage and Shipping
• Dimensions Listed in Inches
• First Dimension Represents the Bag Opening

Higher Case Counts

The photo shown is an example of bag style only. Dimensions listed represent the actual size.